• NSF, 2007-2010, Quantitative Probes for Dynamics in Multiferroic Complex Oxides
• American Chemical Society, 2008-2010, Structures and Defects at Interfaces in Organic Semiconductor Heterostructures
• DOE, 2007-2010, Picosecond Dynamics in Complex Oxide Nanostructures

• "Advances in Scattering Probes for Materials"

Evans PG, Billinge SJL, MRS Bulletin 35 (7): 495-503 Jul 2010.  Recent advances in x-ray and neutron sources, optics, and scattering methods are heralding a new age in the study of the structure and properties of complex materials.

• "Anisotropic relaxation and crystallographic tilt in BiFeO3 on miscut SrTiO3 (001)"

Sichel RJ, Grigoriev A, Do DH, Baek SH, et al., Applied Physics Letters 96(5): 051901 Feb 2010.  X-ray microdiffraction images show that each BiFeO3 mosaic block is rotated by a slightly different angle and contains multiple polarization domains. 

• "Nanostructure formation in the initial roughening of a thin silicon sheet"

Seo S, Euaruksakul C, Savage DE, et al., Physical Review B 81(4): 041302 Jan 2010.  The authors show that the initial destabilization of ultrathin SOI is related to mechanical stress, in contrast to phenomena at later times driven by the energy of the SiO2/Si interface.

• "Molecular structure of extended defects in monolayer-scale pentacene thin films"

Seo S, Evans PG, Journal of Applied Physics 106(10): 103521 Nov 2009.  Two rows of molecules near the stacking fault are shifted along the surface normal by 60 pm.  Electronically relevant trap states may thus be associated with stacking faults in pentacene thin films.

• Materials Research Science and Engineering Center
• Materials Science Program

• Variable temperature scanning probe microscopy
• Electrical characterization of thin films, devices, and nanostructures
• Organic device fabrication